IESNA LM MEASURING LUMEN MAINTENANCE OF LED LIGHT SOURCES MEASUREMENT AND TEST REPORT

Transcription

1 IESNA LM MEASURING LUMEN MAINTENANCE OF LED LIGHT SOURCES MEASUREMENT AND TEST REPORT For Guangzhou Hongli Opto-Electronic Co., Ltd. No.1, Xianke 1st Road, Huadong Town, Huadu District, Guangzhou, China Report Type: 6000 Hours Test Report (See Section 1.9 Report Revision) Product Type: LED Package Test Engineer: Daniel Duan Report Number: RSZ M5 Test Date: to Report Date: Reviewed By: Prepared By: Jeanne Han /Safety Manager Bay Area Compliance Laboratories Corp. (Dongguan). Pu Long Cun 69, Puxinghu Industrial Area, Tangxia Town, Dongguan, Guangdong, P.R.China. Tel: Fax: Note: The test data was only valid for the test sample(s). This test report is prepared for the customer shown above and for the device described herein. It may not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. (Dongguan). This report is valid only with a valid digital signature. The digital signature may be available only under the Adobe software above version 7.0.

2 TABLE OF CONTENTS 1 - GENERAL INFORMATION DESCRIPTION OF LED LIGHT SOURCES STANDARDS USED TEST FACILITY DESCRIPTION OF AUXILIARY EQUIPMENT OPERATING CYCLE AMBIENT CONDITIONS PHOTOMETRY MEASUREMENT UNCERTAINTY SAMPLE SET REPORT REVISION SUMMARY OF TEST RESULT TEST DATA DATA SET 1, 55 C, 150MA (LUMEN MAINTENANCE) DATA SET 1, 55 C, 150MA (CHROMATICITY SHIFT) DATA SET 2, 75ºC, 150MA (LUMEN MAINTENANCE) DATA SET 2, 75ºC, 150MA (CHROMATICITY SHIFT) DATA SET 3, 85 C, 150MA (LUMEN MAINTENANCE) DATA SET 3, 85 C, 150MA (CHROMATICITY SHIFT) APPENDIX A EUT PHOTO A.1 MECHANICAL DIMENSIONS (TA = 25 C) Report No. RSZ M5 Page 2 of 13 IESNA LM Test Report

3 1 - GENERAL INFORMATION 1.1 Description of LED Light Sources Devices tested Part Number: HL-A-2835DW-S1-08-HR3 Part Name: / Part Type: LED Package Nominal CCT: 2700K 1.2 Standards Used IESNA LM-80-08: IES Approved Method for Measuring Lumen Maintenance of LED Light Sources. ENERGY STAR Program Guidance Regarding LED Package, LED Array and LED Module Lumen Maintenance Performance Data Supporting Qualification of Lighting Products(This test method was not accredited by IAS) 1.3 Test Facility The testing facility used by Bay Area Compliance Laboratories Corp. (Dongguan). is located at Pu Long Cun 69, Puxinghu Industrial Area, Tangxia Town, Dongguan, Guangdong, P.R.China. 1.4 Description of Auxiliary Equipment Device Manufacture Model No Serial No Test Range Integral Sphere Programmable Test Power for LEDs EVERFINE Diameter 0.3M nm, length:0.3m,0-1999lumen Calibration date Calibration due date EVERFINE LED300E V/2000mA High accuracy array spectroradiometer EVERFINE HAAS T nm Standard Light Source EVERFINE D K Precision digital stabilized DC power supply LM-80 Aging equipment Digital CC&CV DC Power Supply Multilayer LM-80 aging machine EVERFINE WY605 G115987CJ VA BACL N/A #1 N/A EVERFINE WY (50V/15A) BACL B pcs Multi-channel DC source Tai Shan Xing Guang T01000F2 ST V/1000mA Report No. RSZ M5 Page 3 of 13 IESNA LM Test Report

4 1.5 Operating Cycle Samples are driven with a constant direct current (DC) 1.6 Ambient Conditions For lumen maintenance test, samples were operated in thermal chambers with minimal ambient airflow. For long term reliability test, the case temperature was controlled by mounting several thermocouples on a sample reliability stress board at the designated thermal measurement point, as shown in APPENDIX. The ambient temperature T A was measured by several thermocouples at a distance of 5 mm above the reliability test board. The relative humidity within chamber was less than 65%. For photometry measurement, temperature was set to 25 C ± 2 C, RH <65%. 1.7 Photometry Measurement Uncertainty The uncertainty of the light output measurements is U=1.59% (K=2), at the 95% confidence level. The uncertainty of the correlated color temperature measurements is U=21K (K=2), at the 95% confidence level. This calibration results traceable to the NATIONAL INSTITUTE OF METROLOGY (NIM). Report No. RSZ M5 Page 4 of 13 IESNA LM Test Report

5 1.8 Sample Set Sampling Method: LED samples for IESNA LM-80 testing consist of units built from a minimum of three manufacturing lots with each manufacturing lot built from different wafer lots built on non-consecutive days. These manufacturing lots are picked to represent a wide parametric distribution. Each Sample is soldered to all of the reliability stress boards for a given set of IESNA LM-80 tests. Sample Size: Total 75Pcs; The 25pcs samples tested at T S 85 C were received at and tested during to The samples were numbered from 1 to 25. The other 50pcs samples tested at T S 55 C and T S 75 C were received at and tested during to The samples were numbered from 26 to 50 and 51 to 75. Data Set 1: 55 C, 150mA (Tested during to ) Part Number: Number of Units: 25 Actual Case Temperature(T S ): Actual Ambient Temperature(T A ): Life Test Drive Current: Measurement Current: HL-A-2835DW-S1-08-HR3 T S =54.3 C T A =53.8 C I F = 150mA I F = 150mA Data Set 2: 75 C, 150mA (Tested during to ) Part Number: Number of Units: 25 Actual Case Temperature(T S ): Actual Ambient Temperature(T A ): Life Test Drive Current: Measurement Current: HL-A-2835DW-S1-08-HR3 T S =74.1 C T A =73.6 C I F = 150mA I F = 150mA Data Set 3: 85 C, 150mA(Tested during to ) Part Number: Number of Units: 25 Actual Case Temperature(T S ): Actual Ambient Temperature(T A ): Life Test Drive Current: Measurement Current: 1.9 Report Revision HL-A-2835DW-S1-08-HR3 T S =84.2 C T A =82.3 C I F = 150mA I F = 150mA Report Number Report Date Contents RSZ Original report. RSZ M Update the product photo in page 8. RSZ M A footnote is added in the first page. RSZ M Add test results for samples at TS 55 C and TS 75 C and update rated CCT RSZ M Update the format RSZ M Update the logo of accredited body Report No. RSZ M5 Page 5 of 13 IESNA LM Test Report

6 2 - SUMMARY OF TEST RESULT Data Set: Data Set 1, 55 C, 150mA Number of Units: 25 Failures Observed: 0 Test Interval and Test Duration: Average. Lumen Maintenance at 6000 hours: 97.34% Average Chromaticity Shift at 6000 hours ( u v ): h,1000h,2000h,3000h,4000h,5000h,6000h (Tested during to ) Reported TM-21 L 70 Lifetime: >36,000 hours Data Set: Data Set 2, 75 C, 150mA Number of Units: 25 Failures Observed: 0 Test Interval and Test Duration: Average. Lumen Maintenance at 6000 hours: 96.95% Average Chromaticity Shift at 6000 hours( u v ): h,1000h,2000h,3000h,4000h,5000h,6000h (Tested during to ) Reported TM-21 L 70 Lifetime >36,000 hours Data Set: Data Set 3, 85 C, 150mA Number of Units: 25 Failures Observed: 0 Test Interval and Test Duration: Average. Lumen Maintenance at 6000 hours: 95.19% Average Chromaticity Shift at 6000 hours( u v ): h,1000h,2000h,3000h,4000h,5000h,6000h (Tested during to ) Reported TM-21 L 70 Lifetime 35,000 hours Report No. RSZ M5 Page 6 of 13 IESNA LM Test Report

7 3 - Test Data 3.1 Data Set 1, 55 C, 150mA (Lumen Maintenance) No. V F(V) Φ(lm) Lumen Maintenance (%) 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs Ave Med st dev Min Max TM-21 Projection: Test Duration: 6000 hours Failures Observed: 0 α: 5.773E-06 β: Calculated L 70 : 63,000hours Reported L 70 : >36,000hours Report No. RSZ M5 Page 7 of 13 IESNA LM Test Report

8 % Luminous Flux Company:Guangzhou Hongli Opto-Electronic Co., Ltd. 3.2 Data Set 1, 55 C, 150mA (Chromaticity Shift) No. u v CCT(K) Chromaticity Shift ( u v ) 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs Ave Med st dev Min Max % 105% 100% 95% 90% 85% 80% 75% 70% Flux u'v' Time (hours) Chromaticity Shift (Du'v') Report No. RSZ M5 Page 8 of 13 IESNA LM Test Report

9 3.3 Data Set 2, 75ºC, 150mA (Lumen Maintenance) No. V F(V) Φ(lm) Lumen Maintenance (%) 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs Ave Med st dev Min Max TM-21 Projection: Test Duration: 6000 hours Failures Observed: 0 α: 6.474E-06 β: Calculated L 70 : 56,000hours Reported L 70 : >36,000hours Report No. RSZ M5 Page 9 of 13 IESNA LM Test Report

10 % Luminous Flux Company:Guangzhou Hongli Opto-Electronic Co., Ltd. 3.4 Data Set 2, 75ºC, 150mA (Chromaticity Shift) No. u v CCT(K) Chromaticity Shift ( u v ) 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs Ave Med st dev Min Max % 105% 100% 95% 90% 85% 80% 75% 70% Flux u'v' Time (hours) Chromaticity Shift (Du'v') Report No. RSZ M5 Page 10 of 13 IESNA LM Test Report

11 3.5 Data Set 3, 85 C, 150mA (Lumen Maintenance) V F(V) Φ(lm) Lumen Maintenance (%) No. 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs Ave Med st dev Min Max TM-21 Projection: Test Duration: 6000 hours Failures Observed: 0 α: 1.050E-05 β: Calculated L 70 : 35,000 hours Reported L 70 : 35,000 hours Report No. RSZ M5 Page 11 of 13 IESNA LM Test Report

12 % Luminous Flux Company:Guangzhou Hongli Opto-Electronic Co., Ltd. 3.6 Data Set 3, 85 C, 150mA (Chromaticity Shift) u v CCT(K) Chromaticity Shift ( u v ) No. 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs Ave Med st dev Min Max % 105% 100% 95% 90% 85% 80% 75% 70% Flux u'v' Time (hours) Chromaticity Shift (Du'v') Report No. RSZ M5 Page 12 of 13 IESNA LM Test Report

13 Appendix A EUT PHOTO A.1 Mechanical Dimensions (Ta = 25 C) TMP LED Unit: mm ***********END OF REPORT*********** Report No. RSZ M5 Page 13 of 13 IESNA LM Test Report