IESNA LM MEASURING LUMEN MAINTENANCE OF LED LIGHT SOURCES MEASUREMENT AND TEST REPORT. For

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1 IESNA LM MEASURING LUMEN MAINTENANCE OF LED LIGHT SOURCES MEASUREMENT AND TEST REPORT For Edison Opto Corporation 4F,No.800,Chung-Cheng Rd.,Chung-Ho Dist, New Taipei City,Taiwan Report Type: Hours Test Report Product Type: LED Package Test Engineer: Daniel Duan Report Number: RSZ Test Date: to Report Date: Reviewed By: Prepared By: Jeanne Han /EE Manager Bay Area Compliance Laboratories Corp. (Dongguan). Pu Long Cun 69, Puxinghu Industrial Area, Tangxia Town, Dongguan, Guangdong, P.R.China. Tel: Fax: Note: The test data was only valid for the test sample(s). This test report is prepared for the customer shown above and for the device described herein. It may not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. (Dongguan). This report is valid only with a valid digital signature. The digital signature may be available only under the Adobe software above version 7.0.

2 TABLE OF CONTENTS 1 - GENERAL INFORMATION DESCRIPTION OF LED LIGHT SOURCES... 3 FAMILY DECLARATION STANDARDS USED: TEST FACILITY DESCRIPTION OF AUXILIARY EQUIPMENT OPERATING CYCLE AMBIENT CONDITIONS PHOTOMETRY MEASUREMENT UNCERTAINTY SUMMARY OF TEST RESULT TEST DATA DATA SET 1, 55 C, 60 MA (LUMEN MAINTENANCE) DATA SET 1, 55 C, 60 MA (CHROMATICITY SHIFT) DATA SET 2, 85 C, 60 MA (LUMEN MAINTENANCE) DATA SET 2, 85 C, 60MA (CHROMATICITY SHIFT) DATA SET 3, 105 C, 60 MA (LUMEN MAINTENANCE) DATA SET 3, 105 C, 60 MA (CHROMATICITY SHIFT) APPENDIX A EUT PHOTO A.1 MECHANICAL DIMENSIONS (TA = 25 C) A.2 EUT PHOTO APPENDIX B FAMILY DECLARATION Report No. RSZ Page 2 of 14 IESNA LM Test Report

3 1 - GENERAL INFORMATION 1.1 Description of LED Light Sources Devices tested Part Number: 3014 Part Type: LED Package Nominal CCT: 3000K Family Declaration The LED manufacturer Edison Opto Corporation, declared that the LED Package products listed below are designed with identical material and construction processes. The difference between them is their CCT and/or input current. The tested model has the highest power and according to program guidance from ENERGY STAR, warm white and cool white products can be covered. Model type Model name CCT (K) Number of dies Power (Watt) Input Current (ma) Test model 2T01X2WW K Covered model 2T01x2CWxx000xxx 5000K/5700K/6500K Covered model 2T01x2NWxx000xxx 4000K Covered model 2T01x2WWxx000xxx 2700K/3000K/3500K Covered model 2T01x1CWxx000xxx 5000K/5700K/6500K Covered model 2T01x1NWxx000xxx 4000K Covered model 2T01x1WWxx000xxx 2700K/3000K/3500K Standards Used: IESNA LM-80-08: IES Approved Method for Measuring Lumen Maintenance of LED Light Sources. ENERGY STAR Program Guidance Regarding LED Package, LED Array and LED Module Lumen Maintenance Performance Data Supporting Qualification of Lighting Products(This test method was not accredited by IAS) 1.3 Test Facility The testing facility used by Bay Area Compliance Laboratories Corp. (Dongguan). is located at Pu Long Cun 69, Puxinghu Industrial Area, Tangxia Town, Dongguan, Guangdong, P.R.China. Report No. RSZ Page 3 of 14 IESNA LM Test Report

4 1.4 Description of Auxiliary Equipment Device Manufacture Model No Serial No Test Range Integral Sphere EVERFINE Diameter 0.3M nm, length:0.3m,0-1999lumen Calibration date Calibration due date Programmable Test Power for LEDs High accuracy array spectroradiometer EVERFINE LED300E V/2000mA EVERFINE HAAS T nm Standard Light Source SENSING 12V 10W LSD K Precision digital stabilized DC power supply EVERFINE WY605 G115987CJ VA LM-80 Aging equipment BACL N/A #2 N/A Digital CC&CV DC Power Supply EVERFINE WY (50/15A) Operating Cycle Samples are driven with a constant direct current (DC) 1.6 Ambient Conditions For lumen maintenance test, samples were operated in thermal chambers with minimal ambient airflow. For long term reliability test, the case temperature was controlled by mounting several thermocouples on a sample reliability stress board at the designated thermal measurement point, as shown in APPENDIX. The ambient temperature T A was measured by several thermocouples at a distance of 5 mm above the reliability test board. The relative humidity within chamber was less than 65%. For photometry measurement, temperature was set to 25 C ± 2 C, RH <65%. 1.7 Photometry Measurement Uncertainty The uncertainty of the light output measurements is U=1.59% (K=2), at the 95% confidence level. The uncertainty of the correlated color temperature measurements is U=21K (K=2), at the 95% confidence level. This calibration results traceable to the NATIONAL INSTITUTE OF METROLOGY (NIM). Report No. RSZ Page 4 of 14 IESNA LM Test Report

5 1.8 Sample Set Sampling Method: LED samples for IESNA LM-80 testing consist of units built from a minimum of three manufacturing lots with each manufacturing lot built from different wafer lots built on non-consecutive days. These manufacturing lots are picked to represent a wide parametric distribution. Each Sample is soldered to all of the reliability stress boards for a given set of IESNA LM-80 tests. Sample Size: Total 75Pcs; Each Ts test condition 25Pcs The samples tested at TS 55 C, 85 C, 105 C received at and tested during to The samples were numbered from 1 to 25, 26 to 50, 51 to 75. Data Set 1: 55 C, 60mA Part Number: 3014 Number of Units: 25 Actual Case Temperature(T S ): Actual Ambient Temperature(T A ): Life Test Drive Current: Measurement Current: Data Set 2: 85 C, 60mA Part Number: 3014 Number of Units: 25 Actual Case Temperature(T S ): Actual Ambient Temperature(T A ): Life Test Drive Current: Measurement Current: Data Set 3: 105 C, 60mA Part Number: 3014 Number of Units: 25 Actual Case Temperature(T S ): Actual Ambient Temperature(T A ): Life Test Drive Current: Measurement Current: T S =54.5 C T A =51.1 C I F = 60mA I F = 60mA T S =84.4 C T A =82.3 C I F = 60mA I F = 60mA T S =104.4 C T A =103.2 C I F = 60mA I F = 60mA Report No. RSZ Page 5 of 14 IESNA LM Test Report

6 2 - SUMMARY OF TEST RESULT Data Set: Data Set 1, 55 C, 60mA Number of Units: 25 Failures Observed: 0 Test Interval and Test Duration: Average. Lumen Maintenance at 6000 hours: 97.54% Average Chromaticity Shift at 6000 hours ( u v ): Average. Lumen Maintenance at hours: 96.01% Average Chromaticity Shift at hours ( u v ): h,1000h,2000h,3000h,4000h,5000h,6000h,7000h,8000h, 9000h,10000h Calculated TM-21 L 70 Lifetime: Reported TM-21 L 70 Lifetime: 81,000 hours >60,000 hours Data Set: Data Set 2, 85 C, 60mA Number of Units: 25 Failures Observed: 0 Test Interval and Test Duration: Average. Lumen Maintenance at 6000 hours: 96.99% Average Chromaticity Shift at 6000 hours( u v ): Average. Lumen Maintenance at hours: 94.78% Average Chromaticity Shift at hours( u v ): h,1000h,2000h,3000h,4000h,5000h,6000h,7000h,8000h, 9000h,10000h Calculated TM-21 L 70 Lifetime: Reported TM-21 L 70 Lifetime: 58,000 hours 58,000 hours Data Set: Data Set 3, 105 C, 60mA Number of Units: 25 Failures Observed: 0 Test Interval and Test Duration: Average. Lumen Maintenance at 6000 hours: 96.29% Average Chromaticity Shift at 6000 hours( u v ): Average. Lumen Maintenance at hours: 93.77% Average Chromaticity Shift at hours( u v ): h,1000h,2000h,3000h,4000h,5000h,6000h,7000h,8000h, 9000h,10000h Calculated TM-21 L 70 Lifetime: Reported TM-21 L 70 Lifetime: 51,000 hours 51,000 hours Report No. RSZ Page 6 of 14 IESNA LM Test Report

7 3 - Test Data 3.1 Data Set 1, 55 C, 60 ma (Lumen Maintenance) V F(V) Φ(lm) Lumen Maintenance (%) No. 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs 7000hrs 8000hrs 9000hrs 10000hrs Ave Med st dev Min Max TM-21 Projection: Test Duration: hours Failures Observed: 0 α: 4.444E-06 β: Calculated L 70 : 81,000 hours Reported L 70 : >60,000 hours Report No. RSZ Page 7 of 14 IESNA LM Test Report

8 % Luminous Flux Edison Opto Corporation 3.2 Data Set 1, 55 C, 60 ma (Chromaticity Shift) u v CCT(K) Chromaticity Shift ( u v ) No. 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs 7000hrs 8000hrs 9000hrs 10000hrs Ave Med st dev Min Max % 105% 100% 95% 90% 85% 80% 75% 70% Flux u'v' Time (hours) Chromaticity Shift (Du'v') Report No. RSZ Page 8 of 14 IESNA LM Test Report

9 3.3 Data Set 2, 85 C, 60 ma (Lumen Maintenance) V F(V) Φ(lm) Lumen Maintenance (%) No. 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs 7000hrs 8000hrs 9000hrs 10000hrs Ave Med st dev Min Max TM-21 Projection: Test Duration: hours Failures Observed: 0 α: 6.241E-06 β: Calculated L 70 : 58,000 hours Reported L 70 : 58,000 hours Report No. RSZ Page 9 of 14 IESNA LM Test Report

10 % Luminous Flux Edison Opto Corporation 3.4 Data Set 2, 85 C, 60mA (Chromaticity Shift) u v CCT(K) Chromaticity Shift ( u v ) No. 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs 7000hrs 8000hrs 9000hrs 10000hrs Ave Med st dev Min Max % 105% 100% 95% 90% 85% 80% 75% 70% Flux u'v' Time (hours) Chromaticity Shift (Du'v') Report No. RSZ Page 10 of 14 IESNA LM Test Report

11 3.5 Data Set 3, 105 C, 60 ma (Lumen Maintenance) V F(V) Φ(lm) Lumen Maintenance (%) No. 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs 7000hrs 8000hrs 9000hrs 10000hrs Ave Med st dev Min Max TM-21 Projection: Test Duration: hours Failures Observed: 0 α: 7.161E-06 β: Calculated L 70 : 51,000 hours Reported L 70 : 51,000 hours Report No. RSZ Page 11 of 14 IESNA LM Test Report

12 % Luminous Flux Edison Opto Corporation 3.6 Data Set 3, 105 C, 60 ma (Chromaticity Shift) u v CCT(K) Chromaticity Shift ( u v ) No. 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs 7000hrs 8000hrs 9000hrs 10000hrs Ave Med st dev Min Max % 105% 100% 95% 90% 85% 80% 75% 70% Flux u'v' Time (hours) Chromaticity Shift (Du'v') Report No. RSZ Page 12 of 14 IESNA LM Test Report

13 Appendix A EUT PHOTO A.1 Mechanical Dimensions (Ta = 25 C) All dimensions are in millimeter A.2 EUT Photo TMP LED Report No. RSZ Page 13 of 14 IESNA LM Test Report

14 Appendix B Family Declaration ***********END OF REPORT*********** Report No. RSZ Page 14 of 14 IESNA LM Test Report